Large electric polarization in BiFeO3 film prepared via a simple sol-gel process

BiFeO3 film has been deposited on Pt/Ti/SiO2/Si substrate by a simple sol-gel process annealed at 500 degrees C. X-ray diffraction analysis revealed that the film was fully crystallized and no impure phase was observed. Cross-section scanning electric microscopy results indicated that the thickness was about 600 nm. Large remanent polarization was observed. The double remanent polarization is 95.8 mu C/cm(2) at an applied field of 800 kV/cm. Intense dielectric dispersion was observed above 100 kHz. At a biased electric field of 167 kV/cm, the leakage current densities were identified as similar to 10(-5) to 10(-4) A/cm(2).