Journal
JOURNAL OF RAMAN SPECTROSCOPY
Volume 42, Issue 3, Pages 434-437Publisher
WILEY-BLACKWELL
DOI: 10.1002/jrs.2695
Keywords
zinc oxide; manganese; Raman spectroscopy; Mn(2)O(3); sputtering
Categories
Funding
- NSC of ROC [NSC 98-2112-M-390-002]
Ask authors/readers for more resources
This article aims to investigate the Raman modes present in Mn-doped ZnO thin films that are deposited using the magnetron co-sputtering method. A broad band ranging from 500 to 590 cm(-1) is present in the Raman spectra of heavily Mn-doped ZnO films. The multi-peak-fitting results show that this broad band may be composed of six peaks, and the peak at 528 cm(-1) could be a characteristic mode of Mn(2)O(3). The results of this study suggest that the origin of the Raman peaks in Mn-doped ZnO films may be due to three major types: structural disorder and morphological changes caused by the Mn dopant, Mn-related oxides and intrinsic host-lattice defects. Copyright (C) 2010 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available