Journal
JOURNAL OF RAMAN SPECTROSCOPY
Volume 39, Issue 2, Pages 205-210Publisher
WILEY
DOI: 10.1002/jrs.1874
Keywords
Bi2Te3; BiTe; Bi4Te3; thin films; group theory
Categories
Ask authors/readers for more resources
The deposition of micro- and nanocrystalline bismuth telluride thin films with tailored structure and composition is of interest in view of improving the well-known material thermoelectric properties. Only a few works exist that discuss Raman scattering of Bi2Te3 Crystals and films, while a Raman characterization of other phases, i.e. other lesser known compounds of the Bi-Te system, such as tsumoite (BiTe) and pilsenite (Bi4Te3), is still completely lacking. We here present a Raman investigation of Bi-Te polycrystalline thin films with controlled structure (stoichiometry and growth orientation), morphology and phase composition, produced by nanosecond pulsed laser deposition. Interpretation of Raman spectra from Bi-Te films was supported by scanning electron microscopy, energy dispersive spectroscopy (EDS) and X-Ray diffraction measurements, together with the predictions of the group theory. In this way, the first Raman characterization of Bi-rich phases (namely BiTe and Bi4Te3) has been obtained. For Bi-Te compositions characterized by a high Bi or Te content, Raman spectra reveal that segregation of elemental Bi or Te occurs. Copyright (C) 2008 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available