Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 25, Issue 33, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/25/33/331001
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Flexoelectricity is an increasingly popular subject because it can be extremely large in thin films and permits switching of devices in nonpolar (non-piezoelectric) crystals via application of inhomogeneous stresses. However, recent work has been limited to macroscopic measurement of voltage or strain. Here, we discuss the vibrational spectroscopy of flexoelectricity as a recommended new tool for thin-film characterization, with special emphasis upon incommensurate crystals.
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