Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 24, Issue 8, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/24/8/084009
Keywords
-
Categories
Funding
- UK Engineering and Physical Sciences Research Council (EPSRC) [EP/G007837]
- Leverhulme Trust [F00/114 BI]
- European Framework 6 training network PATTERNS
- EPSRC [EP/G007837/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/G007837/1] Funding Source: researchfish
Ask authors/readers for more resources
We use a noncontact atomic force microscope in the qPlus configuration to investigate the structure and influence of defects on the Si(100) surface. By applying millivolt biases, simultaneous tunnel current data is acquired, providing information about the electronic properties of the surface at biases often inaccessible during conventional STM imaging, and highlighting the difference between the contrast observed in NC-AFM and tunnel current images. We also show how NC-AFM (in the absence of tunnel current) can be used to manipulate both the clean c(4 x 2) surface and dopant-related defects.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available