Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 21, Issue 1, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/21/1/013003
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Funding
- Danish Ministry of Science, Technology and Innovation
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Several approaches for surface-sensitive conductance measurements are reviewed. Particular emphasis is placed on nanoscale multi-point probe techniques. The results for two model systems, which have given rise to some dispute, are discussed in detail: Si(111)(7 x 7) and (root 3 x root 3)Ag-Si(111). Other recent examples are also given, such as phase transitions in quasi-one-dimensional structures on semiconductor surfaces and the surface sheet conductivity of Bi(111), the surface of a semimetal.
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