Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 47, Issue 37, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/47/37/374007
Keywords
terahertz; imaging; scanning laser
Categories
Funding
- [A25249049]
- [A22246043]
- [A23246066]
- [13J05765]
- Grants-in-Aid for Scientific Research [13J05765, 25249049] Funding Source: KAKEN
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The laser terahertz (THz) emission microscope (LTEM) is a unique inspection tool which can directly two-dimensionally map the THz pulse emission from a variety of electric materials and devices. Thus, two-dimensional mapping directly yields various physical information by visualizing the distributions of electric field, supercurrent, ferroelectric domain structures, magnetic fluxes, etc. Based on techniques created for conventional LTEM, we have developed a more highly functional laser THz imaging system, including a scanning laser THz (near-field) imaging system having the performance of high-speed and high-resolution, a scanning probe LTEM coupled with an atomic force microscope for high-resolution imaging, and a dynamic THz emission microscope to investigate the ultrafast carrier dynamics two-dimensionally in the sample. These systems offer diverse characteristics, making them suitable for various applications. We take a look at these systems and some typical applications.
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