Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 47, Issue 26, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/47/26/263001
Keywords
multilayer Laue lens; x-ray nanofocusing optics; thin-film deposition; dynamical diffraction; synchrotron instrumentation; x-ray microscopy
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Funding
- Department of Energy, Office of Basic Energy Sciences [DE-AC-02-98CH10886, DE-AC-02-06CH11357]
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Multilayer Laue lens (MLL) is a new class of x-ray optics that offer great promise for achieving nanometre-level spatial resolution by focusing hard x-rays. Fabricating an MLL via thin-film deposition provides the means to achieve a linear Fresnel-zone plate structure with zone widths below 1 nm, while retaining a virtually limitless aspect ratio. Despite its similarity to the Fresnel-zone plate, MLL exhibits categorically distinctive focusing properties and their fabrication comes with a wide array of challenges. This article provides a comprehensive review of advances in MLLs, and includes extensive theoretical modelling on focusing performance, discussion on fabrication challenges, their current capabilities and notable results from x-ray focusing experiments.
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