Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 41, Issue 10, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/41/10/103001
Keywords
-
Categories
Ask authors/readers for more resources
The review will describe the various scanning probe microscopy tips and cantilevers used today for scanning force microscopy and magnetic force microscopy. Work undertaken to quantify the properties of cantilevers and tips, e. g. shape and radius, is reviewed together with an overview of the various tip - sample interactions that affect dimensional measurements.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available