4.2 Article

Attosecond imaging of XUV-induced atomic photoemission and Auger decay in strong laser fields

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0953-4075/44/10/105601

Keywords

-

Funding

  1. European network ATTOFEL
  2. Max Planck Society
  3. German Science Foundation (DFG)
  4. International Collaboration in Chemistry program
  5. Cluster of Excellence: Munich Center for Advanced Photonics (MAP)
  6. Nederlandse organisatie voor Wetenschappelijk Onderzoek (NWO)
  7. Chemical Sciences, Geosciences, and Biosciences Division, Office of Basic Energy Sciences, Office of Science, US Department of Energy
  8. National Science Foundation [CHE-0822646]
  9. Division Of Chemistry
  10. Direct For Mathematical & Physical Scien [0822646] Funding Source: National Science Foundation

Ask authors/readers for more resources

Velocity-map imaging has been employed to study the photoemission in Ne and N(4,5)OO Auger decay in Xe induced by an isolated 85 eV extreme ultraviolet (XUV) pulse in the presence of a strong few-cycle near-infrared (NIR) laser field. Full three-dimensional momentum information about the released electrons was obtained. The NIR and XUV pulse parameters were extracted from the measured Ne streaking traces using a FROG CRAB retrieval algorithm. The attosecond measurements of the Auger decay in Xe show pronounced broadening of the Auger lines corresponding to the formation of sidebands. The temporal evolution of the sideband signals and their asymmetry along the laser polarization axis exhibit oscillations similar to those known from attosecond streaking measurements. The experimental results are in good agreement with model calculations based on an analytical solution of the Schrodinger equation within the strong field approximation.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.2
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available