Journal
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
Volume 71, Issue 3, Pages 223-229Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.jpcs.2009.11.009
Keywords
Thin Films
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Polycrystalline vanadium pentoxide (V2O5) thin films have been deposited by spray pyrolysis technique on preheated glass substrate. The influence of thermal annealing on the crystallization of V2O5 has been investigated. X-ray diffraction analysis (XRD) revealed that the films deposited at T-sub=350 C were orthorhombic structures with a preferential orientation along <0 0 1> direction. Moreover, the degree of crystallinity was improved by thermal annealing. Optical properties of these samples were studied by spectrophotometer in the wavelength range 300-2500 nm. Some of the important optical absorptions such as optical dispersion energies E-o and E-d, dielectric constant epsilon, ratio between number of charge carriers and effective mass N/m*, wavelength of single oscillator lambda(0), plasma frequency omega(p), single resonant frequency coo and the average of oscillator strength S-0, have been evaluated. In the annealing process, the dielectric properties have weak dependencies of film thickness and annealing time. Furthermore, a value of carrier concentration was obtained of 3.02 x 10(25) m(-3) for the as-deposited film and slight changes with annealing time. (C) 2009 Published by Elsevier Ltd.
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