Journal
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
Volume 69, Issue 11, Pages 2852-2857Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.jpcs.2008.07.013
Keywords
Ceramics; X-ray diffraction; Dielectric properties; Electrical conductivity; Electrical properties
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The polycrystalline samples of Pb(Zr0.65-xMnxTi0.35)O-3 (PZMT) (x = 0, 0.05, 0.10, 0.15) were prepared by a high-temperature solid-state reaction technique. Detailed studies on the effect of compositional variation of manganese (Mn) on the electrical behavior (complex impedance Z*, complex modulus M*, electrical conductivity and relaxation mechanisms) of the PZMT systems have been carried out by a nondestructive complex impedance spectroscopy (CIS) technique at 400 degrees C. The Nyquist plots suggest that the grains only are responsible in the conduction mechanism of the materials. The occurrence of single arc in the complex modulus spectrum of all the compositions of Mn confirms the single-phase characteristics of the PZMT compounds, and also confirms the presence of non-Debye type of multiple relaxation in the material. (C) 2008 Elsevier Ltd. All rights reserved.
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