Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 117, Issue 25, Pages 13324-13330Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jp403983y
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Funding
- Centre of Excellence Low Carbon Technologies (CO NOT)
- Grants-in-Aid for Scientific Research [24681030] Funding Source: KAKEN
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We use noninvasive atomic force microscopy to probe the spatial electrical conductivity of isolated junctions of pristine and nitric acid treated single-walled carbon nanotube networks (SWCNT-N). By analyzing the local IV curves of SWCNTs and bundles with various diameters, the resistance per unit length and the contact resistance of their junctions are estimated to be 316 k Omega/mu m and 29532 k Omega, respectively. We find that the contact resistance decreases with increasing SWCNT or bundle diameter and depends on the contact morphology, reaching a value of 29 k Omega at a diameter of 10 nm. A nitric acid treatment moderately dopes SWCNTs and reduces their average contact resistance by a factor of 3 while the resistance of the nanotubes remains largely unaltered. Remarkably, the same treatment on an SWCNT-N shows similar reduction in the sheet resistance by a factor of 4. These results suggest that the resistance reduction mechanism is related to the contact modulation with no major impact on conductance of SWCNTs.
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