Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 117, Issue 19, Pages 9590-9597Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jp402254r
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Funding
- Center for Solar and Thermal Energy Conversion, an Energy Frontier Research Center
- U.S. Department of Energy Office of Science, Office of Basic Energy Sciences [DE-SC0000957]
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The influence of morphology on the dc conductivity sigma(dc), the charge carrier density n and the out-of-plane mobilities mu were investigated in conjugated polymer films of poly(3-hexylthiophene) (P3HT) using impedance spectroscopy (IS). IS was used for the first time to discern this information from P3HT films. Values of mu, which were found to be film-thickness dependent, increasing with increasing film thickness, h, for films of thickness h > 700 nm, are in excellent agreement with those measured using time-of-flight (ToF) and the method of charge extraction by linearly increasing voltage (CELIV). Both sigma(dc) and n are shown to decrease appreciably with increasing h. The thickness dependent trends in mu, sigma(dc) and n are consistent with changes in the morphology of these films. Conductive atomic force microscopy (CAFM) provided corroborating information, showing an appreciable dependence of carrier transport on the morphology of P3HT.
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