Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 112, Issue 36, Pages 13943-13946Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jp8036457
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Funding
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, [DE-AC02-06CH11357]
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We have performed temporally resolved X-ray excited optical luminescence measurements on Si nanowires. By performing Si K edge X-ray excitation measurements we have determined that the short-lifetime components have primarily Si character, while the long-lifetime component stems from the SiO(2) shell and SiO(2)-Si interface. The lifetime of the short-lifetime component decreases with increasing luminescence energy, i.e., as the size of the nanosilicon species decreases.
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