Journal
JOURNAL OF NUCLEAR MATERIALS
Volume 413, Issue 1, Pages 11-15Publisher
ELSEVIER
DOI: 10.1016/j.jnucmat.2011.03.030
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Funding
- Ministry of Science and Technology of China [2008CB717803, 2010CB832904]
- National Natural Science Foundation of China [11075005]
- Fundamental Research Funds for the Central Universities
- Hong Kong Research Grants Council (RGC) [CityU 112608]
- Materials Science and Engineering Division, Office of Basic Energy Sciences, US Department of Energy [DE-AC05-00OR22725]
- UT-Battelle, LLC
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Magnetron sputtered Cu/W multilayer samples with individual layer thicknesses from 2.5 to 50 nm were irradiated by 50 key He ions at ion fluences from 7 x 10(20) to 6 x 10(21) m(-2) at room temperature. Evolution of the interfacial structure during irradiation is monitored by X-ray diffraction and cross-sectional transmission electron microscopy. Moreover, radiation responses on the individual layer thickness and He+ ion irradiation fluence are revealed. The highly morphological stability of the multilayered structure suggests that the interfacial structure and grain boundary can serve as sinks for radiation-induced defects. (C) 2011 Elsevier B.V. All rights reserved.
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