Journal
JOURNAL OF MODERN OPTICS
Volume 57, Issue 9, Pages 816-825Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/09500341003746645
Keywords
inversion problem; coherent X-ray diffraction; strain analysis; nano-crystals; nano-focusing
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Funding
- ESRF
- French ANR [ANR-08-JCJC-0095-01]
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Bragg coherent X-ray diffraction imaging is demonstrated with a micro-focused illumination. The 2D projected density of the 3D nano-crystal is successfully retrieved from the inversion of its diffraction intensity pattern. The analysis of the phase field at the sample position, which holds in principle the strain information, emphasizes the high sensitivity of the technique with regard to the wavefront structure. The ptychography approach is a proposed solution to discriminate the wavefront function from the sample electron density distribution. It is based on a redundancy of the collected information obtained by measuring a series of diffraction patterns for different but overlapping beam positions onto the sample. Applicability to the Bragg geometry still needs to be demonstrated.
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