Journal
JOURNAL OF MICROSCOPY
Volume 251, Issue 2, Pages 123-127Publisher
WILEY
DOI: 10.1111/jmi.12049
Keywords
Graphene; very low energy STEM
Categories
Funding
- Czech Science Foundation [P108/11/2270]
- Technology Agency of the Czech Republic (Competence Centre: Electron Microscopy) [TE01020118]
- EC
- MEYS CR [CZ.1.05/2.1.00/01.0017]
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Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.
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