Journal
JOURNAL OF MICROSCOPY
Volume 241, Issue 1, Pages 1-8Publisher
WILEY-BLACKWELL PUBLISHING, INC
DOI: 10.1111/j.1365-2818.2010.03454.x
Keywords
Complexity; fractal; irregularity; metrology; morphology; randomness; resolution
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P>Fractal geometry, developed by B. Mandelbrot, has provided new key concepts necessary to the understanding and quantification of some aspects of pattern and shape randomness, irregularity, complexity and self-similarity. In the field of microscopy, fractals have profound implications in relation to the effects of magnification and scaling on morphology and to the methodological approaches necessary to measure self-similar structures. In this article are reviewed the fundamental concepts on which fractal geometry is based, their relevance to the microscopy field as well as a number of technical details that can help improving the robustness of morphological analyses when applied to microscopy problems.
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