Journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 20, Issue 3, Pages 197-201Publisher
SPRINGER
DOI: 10.1007/s10854-008-9698-x
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ZnO films were deposited on Al2O3 substrates by metalorganic chemical vapor deposition (MOCVD) at temperatures of 400, 450 and 500 A degrees C. The photoconductivity of the films has been analyzed for ultraviolet detector application. The changes in photoresponse and current-voltage (I-V) are correlated with the deposition temperatures and microcrystalline structures. The study suggested that the photoresponse originating from bulk- and surface-related processes. For a film deposited at 400 A degrees C, a 1 ms fast rising time and a 5 ms fall time were observed. The photoresponsivity is 24 A/W with a 3 V bias.
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