Journal
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Volume 30, Issue 12, Pages 1271-1277Publisher
JOURNAL MATER SCI TECHNOL
DOI: 10.1016/j.jmst.2014.07.011
Keywords
Al-Si-Mg alloys; Electron backscatter diffraction (EBSD); Transmission electron microscopy (TEM); Dynamic recrystallization; Hot extrusion
Funding
- Jiangsu Graduated-student Innovation Program of China [CXZZ-0146]
- Scientific Research Foundation of Graduate School of Southeast University [YBJJ1235]
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By using electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM), the effect of Si content on microstructure characteristics of three as-extruded Al-Si-Mg alloys was investigated. Results showed that the density of coarse Si particles played a critical role in dynamic recrystallization. Dynamic recrystallization rarely occurred in Si alloy with less Si content; however, it happened in the Si-rich zones in S2 alloy with a medium Si content. And a mature recrystallization was observed in S3 alloy with high Si content. Although deformation was carried out at high temperature, particle-stimulated dynamic recrystallization occurred in Si-rich zones.
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