Dielectric properties and energy storage capability of antiferroelectric Pb0.92La0.08Zr0.95Ti0.05O3 film-on-foil capacitors

Antiferroelectric (AFE) Pb0.92La0.08Zr0.95Ti0.05O3 (PLZT) films were grown on nickel foils with lanthanum nickel oxide buffer by chemical solution deposition. We observed field-induced AFE-to-ferroelectric (FE) phase transition. The electric field for the AFE-to-FE phase transition (E-AF approximate to 270 kV/cm) and that for the reverse phase transition (E-FA approximate to 230 kV/cm) were measured at room temperature on samples with PUT films of approximate to 1-mu m thickness. Relative permittivity of approximate to 560 and dielectric loss of <0.05 were measured near zero DC bias field. Hysteresis loop analysis showed that energy densities of approximate to 53 and 37 J/cm(3) can be stored and recovered from the film-on-foil capacitors at 25 and 150 degrees C, respectively. Highly accelerated life tests were conducted. The projected mean time to failure is >5000 h when the capacitors are operated at room temperature with an applied field of approximate to 300 kV/cm.