Journal
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume 320, Issue 5, Pages L31-L36Publisher
ELSEVIER
DOI: 10.1016/j.jmmm.2007.07.026
Keywords
magnetic semiconductor; TiO2; thin films
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Thin films of pure TiO2 have been prepared using both spin-coating and sputter-deposition techniques on sapphire and quartz substrates. The structural characteristics of the films have been investigated in detail using Raman spectroscopy and high-resolution transmission electron microscopy (HRTEM). When annealed in vacuum, all films demonstrate room temperature ferromagnetism, while the air-annealed samples show much smaller, often negligible, magnetic moments. The magnetization of the vacuum-annealed sputtered samples depends on film thickness, with the volume magnetization decreasing monotonically with increasing thickness. Furthermore, the magnetization per unit area also decreases slightly with increasing film thickness. These results suggest that ferromagnetism in the vacuum-annealed TiO2 films is mediated by surface defects or interfacial effects, but does not arise from stoichiometric crystalline TiO2. (C) 2007 Elsevier B.V. All rights reserved.
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