Journal
JOURNAL OF LOW TEMPERATURE PHYSICS
Volume 151, Issue 3-4, Pages 884-890Publisher
SPRINGER/PLENUM PUBLISHERS
DOI: 10.1007/s10909-008-9760-3
Keywords
bolometer; surface event; thin film sensor; thermal modelling
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A new generation of germanium composite bolometers, equipped with NbSi thin films, has been developed in the framework of the EDELWEISS experiment, presenting impressive surface event identification capabilities and a substantial improvement in the background rejection of heat and ionization detectors. In this work we present a simple thermal model which explain the surface-event identification mechanism via NbSi thin films sensors.
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