Journal
JOURNAL OF LOSS PREVENTION IN THE PROCESS INDUSTRIES
Volume 22, Issue 5, Pages 600-606Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.jlp.2009.04.006
Keywords
Dynamic failure assessment; Dynamic risk assessment; Failure probability; Accident precursor data; Bayesian theory
Categories
Funding
- Natural Science and Engineering Research Council (NSERC)
- College of Engineering Qatar University
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To ensure the safety of a process system, engineers use different methods to identify the potential hazards that may cause severe consequences. One of the most popular methods used is quantitative risk assessment (QRA) which quantifies the risk associated with a particular process activity. One of QRA's major disadvantages is its inability to update risk during the life of a process. As the process operates, abnormal events will result in incidents and near misses These events are often called accident precursors A conventional QRA process is unable to use the accident precursor information to revise the risk profile To overcome this, a methodology has been proposed based on the work of Meel and Seider (2006). Similar to Meel and Seider (2006) work, this methodology uses Bayesian theory to update the likelihood of the event occurrence and also failure probability of the safety system. In this paper the proposed methodology is outlined and its application is demonstrated using a simple case study. First, potential accident scenarios are identified and represented in terms of an event tree. next. using the event tree and available failure data end-state probabilities are estimated Subsequently, using the available accident precursor data, safety system failure likelihood and event tree end-state probabilities are revised The methodology has been simulated using deterministic (point value) as well as probabilistic approach This Methodology is applied to a case study demonstrating a storage tank containing highly hazardous chemicals. The comparison between conventional QRA and the results from dynamic failure assessment approach shows the significant deviation in system failure frequency throughout the life time of the process unit. (C) 2009 Elsevier Ltd. All rights reserved
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