Journal
JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 28, Issue 4, Pages 360-364Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JLT.2009.2032071
Keywords
Fourier spectroscopy; optical fibers; optical fiber measurements
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A non-destructive technique to measure an optical fiber's refractive index profile with sub-mu m spatial resolution over a wavelength range spanning more than one octave (from 480 to 1040 nm) in a single measurement is described. Data showing the variation of refractive index with wavelength for several fiber types is presented.
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