Journal
JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES
Volume 39, Issue 12, Pages 1236-1248Publisher
SPRINGER
DOI: 10.1007/s10762-018-0538-7
Keywords
Quartz; Silica; SiO2; Refractive index; Polariton; Dispersion; Terahertz; Time-domain spectroscopy; Optical pump terahertz probe OPTPS
Funding
- UK Engineering and Physical Sciences Research Council UK
- European Union [735008]
- EPSRC [EP/P006329/1, EP/P033229/1, EP/M017095/1] Funding Source: UKRI
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Characterisation of materials often requires the use of a substrate to support the sample being investigated. For optical characterisation at terahertz frequencies, quartz is commonly used owing to its high transmission and low absorption at these frequencies. Knowledge of the complex refractive index of quartz is required for analysis of time-domain terahertz spectroscopy and optical pump terahertz probe spectroscopy for samples on a quartz substrate. Here, we present the refractive index and extinction coefficient for alpha-quartz between 0.5 THz and 5.5 THz (17-183 cm(-1)) taken at 10, 40, 80, 120, 160, 200 and 300 K. Quartz shows excellent transmission and is thus an ideal optical substrate over the THz band, apart from the region 3.9 +/- 0.1 THz owing to a spectral feature originating from the lowest energy optical phonon modes. We also present the experimentally measured polariton dispersion of alpha-quartz over this frequency range.
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