4.6 Article

Ultra-narrow linewidth measurement based on Voigt profile fitting

Journal

OPTICS EXPRESS
Volume 23, Issue 5, Pages 6803-6808

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OE.23.006803

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Funding

  1. National Natural Science Foundation of China [61177073]
  2. Major Applied Basic Research Project in the Research Program of National University of Defense Technology [ZDYYJCYJ20140701]

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We study the method of Voigt profile fitting for ultra-narrow linewidth measurement. It filters out the effect of the spectrum broadening due to the 1/f frequency noise and extracts out the Lorentzian lineshape from the measured spectrum. The resolution is thus greatly promoted than the direct measurement from the self-heterodyne technique. We apply this method to an ultra-narrow-linewidth (similar to 40 Hz by heterodyne beat technique) Brillouin/erbium fiber laser. The linewidth estimated from Voigt fitting method is indicated to be more accurate. In contrast, the linewidths estimated direct from the 3-dB and the 20-dB heterodyne-spectrum width are far over the true linewidth of the BEFL. The Voigt fitting method provides an efficient tool for ultra-narrow-linewidth measurement. And compared with heterodyne beat technique, it is applicable for all types of lasers. (C) 2015 Optical Society of America

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