Journal
OPTICS AND LASERS IN ENGINEERING
Volume 66, Issue -, Pages 158-164Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2014.09.008
Keywords
3D shape measurement; Fringe analysis; Binary defocusing; Dithering; Optimization
Categories
Funding
- Research Fund for the Doctoral Program of Ministry of Education of China [20123219110016]
- Research and Innovation Plan for Graduate Students of Jiangsu Higher Education Institutions, China [CXLX13_177]
- National Natural Science Foundation of China [61271332]
- Open Research Fund of Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense
Ask authors/readers for more resources
The recently proposed optimized dithering techniques are able to improve measurement quality obviously. However, those phase-based optimization methods are sensitive to the amount of defocusing while intensity-based optimization methods cannot reduce the phase error efficiently. This paper presents a novel method, minimizing a proposed objective function named intensity residual error (IRE), as well as a novel framework, optimizing pixels group by group, to construct binary patterns for high-quality 3D shape measurement. Both the simulation and experimental results show that this proposed algorithm can achieve phase quality improvements over other recently optimized dithering techniques with various amounts of defocusing. (C) 2014 Elsevier Ltd. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available