Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 41, Issue 10, Pages 2893-2898Publisher
SPRINGER
DOI: 10.1007/s11664-012-2126-2
Keywords
CdZnTe; surface; radiation detector; polishing; signal-to-noise ratio
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Funding
- DTRA [HDTRA1-10-1-0113]
- Division Of Chemistry
- Direct For Mathematical & Physical Scien [1126374] Funding Source: National Science Foundation
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The structural and electronic properties of Cd (x) Zn1-x Te (CZT) surfaces have a significant impact on CZT-based radiation detector performance since they can significantly affect a detector's signal-to-noise ratio. Atomically smooth and defect-free surfaces are desirable for high-performance CZT-based detectors. We studied in this work the effects of chemomechanical polishing on the structural and electronic properties of Cd0.9Zn0.1Te. CZT samples were polished using two different-sized abrasives and then purely chemically to create atomically smooth surfaces. The surface structure and surface electronic properties were characterized by atomic force microscopy, x-ray photoelectron spectroscopy (XPS), and photoluminescence (PL). Surface roughness of about 1 nm was routinely achieved using 1.0-mu m- and 0.05-mu m-sized aluminum abrasives followed by chemical polishing. XPS indicates that the polished surfaces are not stoichiometric and have similar to 1-nm-thick layers of TeO2 on them. PL indicates high-quality CZT at the surface region with full-width at half-maximum of 0.363 meV for the neutral donor exciton peak.
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