Related references
Note: Only part of the references are listed.
Article
Materials Science, Multidisciplinary
Extreme temperature 6H-SiC JFET integrated circuit technology
Philip G. Neudeck et al.
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE (2009)
Article
Engineering, Electrical & Electronic
High-temperature electronics - A role for wide bandgap semiconductors?
PG Neudeck et al.
PROCEEDINGS OF THE IEEE (2002)
Article
Physics, Applied
Reliability assessment of Ti/TaSi2/Pt ohmic contacts on SiC after 1000 h at 600 °C
RS Okojie et al.
JOURNAL OF APPLIED PHYSICS (2002)
Share Paper
