Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 39, Issue 4, Pages 456-463Publisher
SPRINGER
DOI: 10.1007/s11664-010-1097-4
Keywords
Arc erosion; contact material; AgCdO; scanning electron microscope (SEM)
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Funding
- Research Engineer at Leach Int.
- Research Engineer at LETAM
- Leach Int. President
- Leach Int. General Manager
- Leach Int. RD Manager
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This paper describes a study of the evolution of the AgCdO contact material surface microstructure as a function of the number of electrical arcs imposed on the switching surface. Five power switching devices were tested under different conditions. They were subjected to, respectively, 1, 2, 3, 10, and 100 electrical arcs under the same operating conditions: supply current of 400 A, circuit voltage of 28 V direct current (DC), and resistive load. For the analysis, a binocular microscope and a scanning electron microscope with an energy-dispersive x-ray spectrometer were used.
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