In situ hard X-ray quick RIXS to probe dynamic changes in the electronic structure of functional materials

Hard X-ray RIXS permits monitoring the electronic state of materials under in situ conditions. Time resolved, or quick RIXS, allows following dynamic changes in the electronic structure, which enables the identification of short-lived reaction intermediates. Within, we report the development of in situ quick RIXS spectroscopy, using a wavelength dispersive spectrometer operated in the von Hamos geometry. The main operational characteristics and performance of this experimental setup are presented. Dynamic changes in electronic structure are reported for the first time with quick RIXS, demonstrated on the reduction of Au2O3. The quick RIXS methodology can be implemented at any spectroscopy hard X-ray beamline. Therefore we envisage this tool to be widely used in the study of materials dynamic electronic changes. (C) 2012 Elsevier B.V. All rights reserved.