Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 185, Issue 5-7, Pages 159-166Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2012.06.008
Keywords
XPS; Ni oxides; Atomic ratios; Mixed phase oxides
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Funding
- NSERC
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The O/Ni ratios derived from the X-ray photoelectron (XP) spectra of a number of well-characterised Ni oxides were calculated and found to correspond well to the expected O/Ni ratios for these oxides. The measured ratios, combined with the characteristic XP spectra, provide a higher level of confidence to the assignment of O 1s chemical species, particularly for surfaces with multiple phases present. As examples of this, we discuss the additional information imparted by O/Ni ratios measured for oxides that were electrochemically grown on Ni and NiCr-20% alloy surfaces. (c) 2012 Elsevier B.V. All rights reserved.
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