Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 185, Issue 10, Pages 330-339Publisher
ELSEVIER
DOI: 10.1016/j.elspec.2012.08.003
Keywords
Photoemission microscopy; Immersion lens; Spectromicroscopy; XPS; Fermi surface; HAXPES
Categories
Funding
- Deutsche Forschungsgemeinschaft [SFB 491, SFB 917]
- German Ministry of Education and Research BMBF [05KS7UK1]
- CEA nanoscience programme
- French National Research Agency (ANR) through the Recherche Technologique de Base (RTB) program
Ask authors/readers for more resources
The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopy to be carried out with nanometer lateral resolution, i.e. nanospectroscopy. This goal can be achieved by combining a parallel imaging photoelectron emission microscope with a bandpass energy filter. In this contribution we describe selected experiments employing a dedicated spectromicroscope - the NanoESCA. This instrument has a particular emphasis on the spectroscopic aspects and enables laterally resolved photoelectron spectroscopy from the VUV up into the hard X-ray regime. (C) 2012 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available