4.1 Article

Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES

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Publisher

ELSEVIER
DOI: 10.1016/j.elspec.2012.08.003

Keywords

Photoemission microscopy; Immersion lens; Spectromicroscopy; XPS; Fermi surface; HAXPES

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Funding

  1. Deutsche Forschungsgemeinschaft [SFB 491, SFB 917]
  2. German Ministry of Education and Research BMBF [05KS7UK1]
  3. CEA nanoscience programme
  4. French National Research Agency (ANR) through the Recherche Technologique de Base (RTB) program

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The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopy to be carried out with nanometer lateral resolution, i.e. nanospectroscopy. This goal can be achieved by combining a parallel imaging photoelectron emission microscope with a bandpass energy filter. In this contribution we describe selected experiments employing a dedicated spectromicroscope - the NanoESCA. This instrument has a particular emphasis on the spectroscopic aspects and enables laterally resolved photoelectron spectroscopy from the VUV up into the hard X-ray regime. (C) 2012 Elsevier B.V. All rights reserved.

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