Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 178, Issue -, Pages 2-32Publisher
ELSEVIER
DOI: 10.1016/j.elspec.2010.01.006
Keywords
X-ray photoelectron spectroscopy; Photoemission; XPS; Photoelectron diffraction; Photoelectron holography; Angle-resolved photoemission; ARPES; Synchrotron radiation
Categories
Funding
- Director, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy [DE-AC02-05CH11231]
- Helmholtz Foundation
- Humboldt Foundation
- Julich Research Center
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In this overview, I will briefly explore some of the basic concepts and observable effects in X-ray photoelectron spectroscopy, including references to some key first publications, as well as other papers in this issue that explore many of them in more detail. I will then turn to some examples of several present and promising future applications of this diverse technique. Some of the future areas explored will be the use chemical shifts, multiplet splittings, and hard X-ray excitation in the study of strongly correlated materials; photoelectron diffraction and holography for atomic structure determinations; standing wave and hard X-ray excited photoemission for probing buried interfaces and more bulk-like properties of complex materials; valence-band mapping with soft and hard X-ray excitation; and time-resolved measurements with the sample at high ambient pressures in the multi-tort regime. (C) 2010 Elsevier B.V. All rights reserved.
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