Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM

An environmental cell for high-temperature, high-resolution transmission electron microscopy of nanomaterials in near atmospheric pressures is developed. The developed environmental cell is a side-entry type with built-in specimen-heating element and micropressure gauge. The relationship between the cell condition and the quality of the transmission electron microscopic (TEM) image and the diffraction pattern was examined experimentally and theoretically. By using the cell consisting of two electron-transparent silicon nitride thin films as the window material, the gas pressure inside the environmental cell is continuously controlled from 10(-5) Pa to the atmospheric pressure in a high-vacuum TEM specimen chamber. TEM image resolutions of 0.23 and 0.31 nm were obtained using 15-nm-thick silicon nitride film windows with the pressure inside the cell being around 5 x 10(-5) and 1 x 10(4) Pa, respectively.