Journal
JOURNAL OF ELECTRON MICROSCOPY
Volume 59, Issue 5, Pages 379-385Publisher
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfq012
Keywords
backscattered electron; field emission scanning electron microscopy; thin film elements; discrimination; labeling; acceleration voltage
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Funding
- Kanagawa Academy of Science of Technology
- Sumitomo Foundation
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Discrimination of thin film elements by backscattered electron (BSE) imaging of field emission scanning electron microscope was examined. Incident electron acceleration voltage dependence on thin films' BSE intensities in five elements (Au, Ag, Ge, Cu and Fe) on a silicon substrate was experimentally measured from 3 to 30 kV. Normalization of BSE intensities using the difference between maximum and minimum brightness was proposed and allowed reproducible comparison among the elements. Measured intensities, which have correlation with electron backscattering coefficient against atomic number, indicated the existence of adequate acceleration voltage for improvement of resolution to discriminate different elements, showing the possibility of discriminating at least these six elements simultaneously by BSE imaging with nanometer-scale spatial resolution.
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