Journal
JOURNAL OF ELECTRON MICROSCOPY
Volume 58, Issue 3, Pages 147-155Publisher
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfp021
Keywords
aberration correction; chromatic aberration; oxides; EFTEM; HRTEM
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Contrast-transfer calculations indicate that C-c correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first C-c-corrected energy-filtered experiments examining a (LaAlO3)(0.3)(Sr2AlTaO6)(0.7)/LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.
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