4.7 Article

Nickel sulfur thin films deposited by ECALE: Electrochemical, XPS and AFM characterization

Journal

JOURNAL OF ELECTROANALYTICAL CHEMISTRY
Volume 638, Issue 1, Pages 15-20

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jelechem.2009.10.027

Keywords

ECALE; AFM; Nickel sulfide; XPS; HER

Ask authors/readers for more resources

This paper reports on a study of the electrodeposition of nickel sulfide thin films on Ag(1 1 1) by the Electrochemical Atomic Layer Epitaxy (ECALE) technique. The multilayer growth of nickel sulfide has been studied by cyclic and stripping voltammetry. The composition of the films was studied by XPS analysis and the morphology was studied by Atomic Force Microscopy (AFM). The phenomenological observation of the hydrogen evolution reaction (HER) suggests the presence of electrocatalytic properties of the thin films obtained. (c) 2009 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available