Journal
JOURNAL OF ELECTROANALYTICAL CHEMISTRY
Volume 638, Issue 2, Pages 225-230Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jelechem.2009.11.004
Keywords
Ultrathin CuSO4 solution layer; Electrodeposition; Compositional distribution; Submicron/nanoscale Cu2O/Cu junctions; Abnormal growth
Categories
Funding
- National Natural Science Foundation of PR China [50802055, 50702031, 50872066]
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The electrodeposition experiments were carried out in an ultrathin CuSO4 solution layer under lower growth driving forces and the structure of electrodeposits were characterized by FESEM, chemical etching, EDS and DC conducting measurement. It was found that the Cu2O crystallites distributed over the entire sample Surface and formed submicion/nanoscale Cu2O/Cu junctions. Meanwhile. the abnormal growth of Cu2O crystallites in the electrodeposit front area Was found for the first time In the study, we present the obvious evidences for clarifying the relationship between the morphology and the compositional distribution of electrodeposits at grain size level. This result may be helpful for us to prepare the electrodeposits with controlled surface morphology at micro-nanoscale. (C) 2009 Elsevier B.V. All rights reserved.
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