Journal
JOURNAL OF CRYSTAL GROWTH
Volume 352, Issue 1, Pages 53-58Publisher
ELSEVIER
DOI: 10.1016/j.jcrysgro.2011.12.009
Keywords
X-ray diffraction; Growth from melt; Semiconducting silicon; Optical fiber devices
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Crystalline semiconductor core optical fibers have received growing attention as greater understanding of the underlying materials science, coupled with advances in fiber processing and fabrication, have expanded the quality and portfolio of available materials. In a continued effort to better understand the nature of the crystal formation this work studies the role of the cross-sectional geometry on the resultant core crystallography with respect to the fiber axis. More specifically, a molten-core approach was used to fabricate silicon optical fibers clad in silica tubes of either circular or square inner cross-sections. In both geometric cases, the silicon core was found to possess regions of single crystallinity where specific crystal orientations persisted along a fiber length of about 4-5 mm prior to transitioning through polycrystalline regions. However, the rotation and tilting angular combination needed to align a given crystallographic axis with the fiber axis was more constant over the single crystalline region in the case of the square-core fiber while more significant variations were observed in the round-core case. This work begins to elucidate some of the microstructural features, not present in conventional glass optical fibers, that could be important for future low-loss single crystalline semiconductor optical fibers. (C) 2011 Elsevier B.V. All rights reserved.
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