Journal
JOURNAL OF CRYSTAL GROWTH
Volume 312, Issue 14, Pages 2093-2097Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2010.04.033
Keywords
Structure; Film; Sputtering
Funding
- Korea government (MEST) [KRF-2007-313-C00262]
- NRF [2009-0085915]
- Korea MEST
- National Research Foundation of Korea [2009-0085915] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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High quality Zn1-xFexO thin films were deposited on alpha-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2+ and 3+ states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn1-xFexO films strongly suggested that the ferromagnetism was the intrinsic properties of the films. (C) 2010 Elsevier B.V. All rights reserved.
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