4.4 Article

Structural characterization of TiO2 films grown on LaAlO3 and SrTiO3 substrates using reactive molecular beam epitaxy

Journal

JOURNAL OF CRYSTAL GROWTH
Volume 310, Issue 3, Pages 545-550

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2007.10.084

Keywords

electron energy loss spectrometry; transmission electron microscopy; molecular beam epitaxy; TiO2

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We have studied the microstructure of TiO2 films, grown by reactive molecular beam epitaxy (MBE) on LaAlO3 (LAO) and SrTiO3 (STO) substrates, using a combination of transmission electron microscopy (TEM) and electron energy loss spectrometry (EELS). TiO2 films grew epitaxially in the anatase polymorph and exhibited the crystallographic orientation relation of (001)(010)(TiO2)parallel to(001)(010)(substrate). High-resolution TEM and EELS studies indicated the presence of a cubic TiOx phase at the TiO2/STO interface. Interfacial TiOx phases were eliminated and a sharp TiO2/STO interface was achieved by growing the TiO2 film on a heteroepitaxial STO buffer layer. (C) 2007 Elsevier B.V. All rights reserved.

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