Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 802, Issue -, Pages 10-15Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2015.08.048
Keywords
GEM; EIC; Single-mask; Tracking; Micro-pattern gas detectors
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Funding
- EIC RD grant
- Brookhaven Science Associates [223228]
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With interest in large area GEM foils increasing and CERN being the only main distributor, keeping up with the demand for GEM foils will be difficult. Thus the commercialization of GEMs is being established by Tech-Etch of Plymouth, MA, USA using single-mask techniques. We report here on the first of a two step quality verification of the commercially produced 10 x 10 cm(2) and 40 x 40 cm(2) GEM foils, which includes characterizing their electrical and geometrical properties. We have found that the Tech-Etch foils display excellent electrical properties, as well as uniform and consistent hole diameters comparable to established foils produced by CERN. (C) 2015 Elsevier B.V. All rights reserved,
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