4.7 Article

Effects of CMP slurry additives on the agglomeration of alumina nanoparticles 1: General aggregation rate behavior

Journal

JOURNAL OF COLLOID AND INTERFACE SCIENCE
Volume 419, Issue -, Pages 56-60

Publisher

ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jcis.2013.12.029

Keywords

Agglomeration; Aggregation; Nanoparticles; Chemical mechanical planarization; Zeta potential; Isoelectric point

Funding

  1. University of California, Berkeley IMPACT program
  2. Applied Materials
  3. AMSL
  4. Ebara Technologies
  5. Global Foundries
  6. IBM
  7. Intel Corporation
  8. KLA-Tenco2r
  9. Marvell
  10. Mentor Graphics
  11. Novellus Systems
  12. Panoramic Tech
  13. SanDisk
  14. Synopsys
  15. Tokyo Electron Limited
  16. Xilinx Inc
  17. UC Discovery Grant [ele07-10283]

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The aggregation behavior for 150 nm alumina particles suspended in 1 mM KNO3 solutions with various additives used in chemical mechanical planarization of copper was investigated. Three behaviors were observed: no aggregation, reversible aggregation where large agglomerates formed almost instantaneously, and steady aggregation where particle sizes grew over the duration of the measurement. In general steady aggregation occurred at high pH for all suspensions, while no aggregation occurred at acidic pH, except with suspensions with sodium dodecyl sulfate, where reversible aggregation was observed. No aggregation was observed at near neutral pH for all suspensions. Zeta potential and isoelectric points for each suspension were also measured. (C) 2013 Elsevier Inc. All rights reserved.

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