Structure and morphology of coevaporated pentacene-perfluoropentacene thin films

The structural properties of coevaporated thin films of pentacene (PEN) and perfluoropentacene (PFP) on SiO2 were studied using x-ray reflectivity and grazing incidence x-ray diffraction. Reciprocal space maps of the coevaporated thin films with different volume fractions reveal the coexistence of two different molecular mixed PEN-PFP phases together with the pure PEN and PFP crystallites. The crystal structure of PEN: PFP blends does not change continuously with volume fraction, instead the proportion of the appropriate phases changes, as seen from the diffraction analysis. Additional temperature dependent experiments reveal that the fraction of the two mixed PEN-PFP phases varies with growth temperature. The lambda-phase (molecular plane parallel to the substrate) is metastable and induced by low growth temperature. The sigma-phase (molecular plane nearly perpendicular to the substrate) is thermally stable and nucleates predominantly at high growth temperatures. (C) 2011 American Institute of Physics. [doi:10.1063/1.3557476]