Journal
JOURNAL OF CHEMICAL PHYSICS
Volume 130, Issue 11, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3089789
Keywords
atomic force microscopy; deformation; elemental semiconductors; friction; island structure; monolayers; organic compounds; self-assembly; silicon; surface conductivity; surface topography
Funding
- Office of Energy Research, Office of Basic Energy Sciences, Molecular Foundry, Materials Sciences Division, U. S. Department of Energy through the Lawrence Berkeley National Laboratory [DE-AC02-05CH11231]
- Korea Science and Engineering Foundation [31-2008-000-10055-0]
- National Research Foundation of Korea [R31-2008-000-10055-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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The correlation between molecular conductivity and mechanical properties (molecular deformation and frictional responses) of hexadecylsilane self-assembled monolayers was studied with conductive probe atomic force microscopy/friction force microscopy in ultrahigh vacuum. Current and friction were measured as a function of applied pressure, simultaneously, while imaging the topography of self-assembled monolayer molecule islands and silicon surfaces covered with a thin oxide layer. Friction images reveal lower friction over the molecules forming islands than over the bare silicon surface, indicating the lubricating functionality of alkylsilane molecules. By measuring the tunneling current change due to changing of the height of the molecular islands by tilting the molecules under pressure from the tip, we obtained an effective conductance decay constant (beta) of 0.52/A.
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