Journal
JOURNAL OF APPLIED POLYMER SCIENCE
Volume 115, Issue 1, Pages 263-268Publisher
JOHN WILEY & SONS INC
DOI: 10.1002/app.31096
Keywords
polyurethane; thermal analysis; x-ray diffraction
Categories
Ask authors/readers for more resources
Fourier Transformed Infrared Spectroscopy, Thermogravimetric Analysis, and X-ray Diffractometry have been used to investigate the rigid, semi rigid, and soft polyurethane (PU) forms, which were developed by the Group of Analytic Chemistry and Technology of Polymers - USF - Sao Carlos. The -NCO/-OH ratios were 0.6, 0.5, and 0.3% for rigid, semi rigid, and soft PUs, respectively, showing that different ratios cause differences in thermal behaviors and crystalline structures of the synthesized PU resins. (C) 2009 Wiley Periodicals, Inc. J Appl Polym Sci 115: 263-268, 2010
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available