Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 6, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4891352
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Funding
- COST action [MP0702 (STSM 8171)]
- Science Foundation Ireland [10/RFP/MTR2855, SFI07/IN1/B931]
- Swedish Research Council [VR 622-2010-526, 621-2011-4040]
- ADOPT Linnaeus Centre for Advanced Optics and Photonics in Stockholm
- Science Foundation Ireland (SFI) [10/RFP/MTR2855] Funding Source: Science Foundation Ireland (SFI)
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We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d(33) coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 +/- 2% and 68 +/- 3% of the LiNbO3 value, for undoped and 5mol. % MgO-doped substrates, respectively. (C) 2014 AIP Publishing LLC.
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